Description

National Instruments PCIe‑6376 X‑Series Simultaneous‑Sampling Multifunction DAQ Card

Technical Specifications

• Product Model: PCIe‑6376
• Brand: National Instruments (NI)
• Warranty: One Year
• Input Voltage: PCIe bus‑powered, +12 V / +3.3 V from host motherboard
• Operating Temperature: 0 °C ~ +55 °C
• Storage Temperature: ‑40 °C ~ +70 °C
• Response Time: 10 ns timing resolution; max 3.571 MS/s per‑channel simultaneous sampling
• Protection Class: IP20 (desktop PC internal expansion card)
• Accuracy Class: 16‑bit ADC, no missing codes; measurement category I only
• Output Frequency: Analog output update rate up to 2.86 MS/s
• Rated Current: Typical 2.2 A total PCIe slot consumption
• Analog Input: 8‑channel fully‑differential simultaneous sampling, 16‑bit resolution; input ranges ±1 V, ±2 V, ±5 V, ±10 VNI
• Analog Output: 2‑channel 16‑bit voltage output
• Digital I/O: 24‑channel bidirectional DIO (PFI programmable function inputs)
• Counters/Timers: 4 × 32‑bit general‑purpose counters‑timersNI
• Host Bus: PCI Express x4 (compatible with x4/x8/x16 PCIe slots)NI
• Synchronization: RTSI bus for multi‑device triggering & clock sharing
• On‑board ASIC: NI‑STC3 timing‑synchronization engine, retriggerable measurement tasks supportedNI
• Driver Requirement: NI‑DAQmx driver software
• Humidity: 10‑90 % RH, non‑condensing
• OEM Part Number: 785809‑01NI
• Weight: 0.28 kg
• Dimensions: Standard full‑height PCIe form‑factor
• 

Product Overview

The PCIe‑6376 is NI X‑series high‑speed simultaneous‑sampling multifunction DAQ board for desktop PC PCI‑Express slots. Unlike multiplexed DAQ hardware, all eight analog‑input channels sample in parallel at up to 3.571 MS/s per‑channel, eliminating phase‑shift errors between multi‑sensor measurement points.

Powered entirely through PCIe slot without external power supply. It integrates high‑speed analog input, analog output, bidirectional digital I/O and four 32‑bit counter‑timer channels. The NI‑STC3 timing chip delivers independent analog‑domain and digital‑domain timing engines, supporting retriggered acquisitions, hardware‑based triggering and multi‑board synchronization via RTSI busNI. Built‑in self‑calibration circuit compensates for temperature drift to sustain long‑term measurement precision. It works seamlessly with LabVIEW, LabWindows/CVI and DAQExpress measurement software for automated test‑system development. Widely available as new‑old‑stock or refurbished spare parts for legacy test‑bench upgrades and system maintenance.

Application Notes

• Install inside standard desktop PC PCI‑Express x4/x8/x16 slot; full‑height bracket by default, low‑profile bracket optional.
• Only for Measurement Category I signals; do not connect to mains‑category high‑voltage circuits.
• Requires NI‑DAQmx driver installation before hardware operation.
• Use shielded SHC‑68‑EP cable mating with NI terminal blocks such as BNC‑2110 for signal wiring.
• RTSI bus cable enables clock‑trigger synchronization across multiple DAQ cards.
• Self‑calibration procedure is recommended after large temperature changes to maintain rated accuracy.
• Typical use‑cases: transient signal recording, IF‑band digitization, ultrasonic testing, telecom component manufacturing ATE, high‑energy‑physics laboratory data acquisitionNI.
• Keep PC enclosure well‑ventilated; avoid dust accumulation and condensation on card assembly.
• Verify driver version compatibility when replacing existing PCIe‑6376 hardware in established test systems.