Description

National Instruments PXIe-6570 32-Channel PXIe Digital Pattern Test Instrument

Technical Specifications

• Product Model: PXIe-6570 (Order PN: 785283-01)
• Brand: National Instruments (NI)
• Warranty: One Year
• Input Voltage: Powered by PXIe chassis backplane 3.3V / 12VDC rails
• Operating Temperature: 0°C ~ +45°C
• Storage Temperature: -40°C ~ +71°C
• Response Time: 100 MHz maximum vector rate, 39.0625 ps ultra-fine edge placement resolution
• Protection Class: IP20 indoor rack installation, built-in ESD and overvoltage channel clamping
• Accuracy Class: Semiconductor ATE-grade timing precision, ±ps-level edge offset control
• Output Frequency: Max 200 Mbps data rate, internal clock generation up to 160 MHz
• Rated Current Range: Per-channel maximum 24mA drive load, 32 total bidirectional channels
• Communication Interface: PXIe high-speed backplane bus, single high-density VHDCI 68-pin front panel connector
• Supported Protocols: Custom digital test vector sequencer, NR/RL/RH/SBC drive formats, onboard sequencer flow control opcodes
• Overload Capacity: Per-pin electronic disconnect protection, EMC industrial surge suppression, DUT ground sense (DGS) fault detection
• Dimensions: Occupies 2 full PXIe slots, standard 3U PXIe module form factor
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Product Overview

The PXIe-6570 is a 2-slot PXI Express modular digital pattern generator and capture instrument built for semiconductor device characterization, validation bench testing and small-batch production test, delivering ATE-class digital test performance on the open PXI industrial test platformNI. Equipped with 32 independent bidirectional pin electronics channels and integrated PPMU (Per-Pin Measurement Unit), it outputs programmable digital test vectors to stimulate IC chips, captures response feedback signals, and executes comprehensive parametric measurement on each device pin simultaneously.

It resolves core limitations of general-purpose DAQ and basic DIO boards for semiconductor testing, including insufficient vector sequencing depth and timing granularity, lack of per-pin parametric voltage/current measurement, limited multi-site parallel testing capacity, and absence of professional debug tools for failure analysis. The module carries 128M vector memory per channel, supports up to 8 parallel test sites, and works with the official NI Digital Pattern Editor software to build pin mapping, voltage levels, timing sets and test sequences, bundled with Shmoo plotting, digital oscilloscope waveform capture, history RAM logging and pin state diagnostic viewers for fast fault pinpointing